Products - Test Systems



Test Instruments

M-D864
M-D864

64 channels @ 800 Mb/s Digital instrument


- Subroutine & full speed APG on all pins
- Gigabits Scan Chain capability
- Gigabits pattern & capture memories
- Accurate PMU per pin

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M-DPS10
M-DPS10

10 channels Device Power Supply


- Current measurement
- Programmable clamp
- Gang capability
- 8 channels with 800 mA current capability
- 2 channels with 5 A current capability

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M-WR48
M-WR48

M-WR48: 48 Wide Range Universal channels with: * High Voltage Digital IO up to 10 Mb/s * [-15..+24V] VI - Device power supply


Key Benefits

- 48 channels switching independently from digital IO to VI source for unique system flexibility
- All digital process support from -15V to +24V (4 banks of 12 pins)
- Scan, APG, subroutine addressing wide device market
- FPGA based controller and on board reconfigurable memories
allow unique client customization

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M-D1632
M-D1632

32 channels @ 1600 Mb/s Digital instrument


- Subroutine & full speed APG on all pins
- Gigabits Scan Chain capability
- Gigabits pattern & capture memories
- Accurate PMU per pin

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M-MiXW
M-MiXW

8 independent Analog channels with: 4 Arbitrary Waveform Generators and 4 Sampler High Accuracy (24 bits) or High Frequency (200Msps) mode for wide range of application


- 4 AWG high accuracy or high frequency
- 4 samplers high accuracy or high frequency
- 8 independent time domains
- Low pass filters
- Programmable ranges
- Independent Ground (GND) sense
- Single ended (SE) or differential
- 50 Ohms, 100 Ohms or unterminated

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